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Testing Part – VI | Electronic Design Automation | Video lecture

Testing Part – VI

TOPICS IN VIDEO:

TESTING – Part VI

Response Compaction

Definitions

Signature analysis

LFSR for Response Compaction

Aliasing Probability

Multiple-lnput Signature Register (MISR)

Modular MISR Example

Summary

BIST benefits:

Boundary Scan

A Testability Standard

System Test Logic

Instruction Register Loading wit JTAG

Serial Board / MCM Scan

Tap Controller Signals

Boundary Scan Instructions

1:19

1:45

4:16

6:21

7:16

13:26

24:20

25:40

29:56

32:15

37:00

37:15

41:25

45:30

49:56

52:10

54:16

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