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Testing Part – V | Electronic Design Automation | Video lecture

Testing Part – V

TOPICS IN VIDEO:

Test Problems Alleviated by BIST

Costs Involved in BIST

Built-in Logic Block Observer (BILBO)

Pattern Generator

Complex BIST Architecture

Pattern Generation

A LFSR Variant (Internal-XOR Based)

4:48

7:47

14:42

17:05

19:12

21:36

29:17

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