Testing Part – IV | Electronic Design Automation | Video lecture

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Testing Part – IV

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TOPICS IN VIDEO:

Design for Testability1:05

Basic Concept

Ad-Hoc DFT Methods

Provide test control for difficult-to-control signals.

Structured Design : : Basic Concept

Scan Design

Scan Design (contd.)

CCET

Scan Design Rules If-?

Correcting a Rule Violation

Testing Scan Register

Total scan test length:

Multiple Scan Registers

Scan Overhead

Hierarchical Scan

Disadvantages:

Automated Scan Design

Partial-Scan

Scan Flip-Flop Selection Methods

Summary

1:05

1:15

3:39

8:10

9:34

13:30

15:34

16:50

17:19

18:15

26:45

28:59

32:24

34:44

39:49

44:55

48:09

48:25

51:30

54:40

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