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Testing Part – III | Electronic Design Automation | Video lecture

Testing Part – III

TOPICS IN VIDEO:

Concurrent Fault Simulation

Advantages and limitations

Basic ldea

What is requires actually?

Path Sensitization

Try path f – h – k – L. This path is blocked at j, since there is no way to justify the 1 on i

Try simultaneous path f – h – k – L and g – i – j – k – L.

Random Pattern Testing

Functional vs. Structural ATPG

Carry Circuit

Functional ATPG

Structural Test

1:35

17:20

19:05

20:14

23:16

28:25

 

31:19

34:07

40:54

43:13

46:15

47:33

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