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Home > Video lecture > CSE > Electronic Design Automation > Testing Part – II | Electronic Design Automation | Video lecture

Testing Part – II | Electronic Design Automation | Video lecture

Testing Part – II

TOPICS IN VIDEO:

Multiple Stuck-at Faults

Transistor (Switch) Faults

Stuck-Open Example

Stuck-Short Example

Problem and Motivation

Select Target Fault Set F

Fault Simulation Techniques

Parallel Fault Simulation

Limitations:

Deductive Fault Simulation

Fault list propogation is carried out under two conditions:

Limitations:

1:19

7:54

9:30

17:43

20:12

21:42

23:36

26:42

39:13

41:37

44:49

 

55:25

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